The PhD student supervised by Professor Yang Guang of the International Dielectric Materials Research Center, XJTU School of Electronic and Information Engineering, obtained the Presidential Scholar award issued by the Microanalysis Society (MAS) on the Microscopy & Microanalysis 2015 (M&M 2015), which was held at Portland, Oregon. The award aims to honor the graduate students who have done outstanding performances in the field of electronic microscope. Li Chao is the only graduate student from mainland China conferred upon such an award. He is also the first XJTU student gaining this award.

Li Chao is from the International Dielectric Materials Research Center. His paper was entitled Atomic resolution studies of the (K, Na) NbO3/SrTiO3 interface using aberration corrected STEM. His research employed the ARM200F aberration corrected STEM, one of the most state of the art.

STEMs erected at the Center at XJTU Qujiang Campus , to examine the NbO3/SrTiO3 interface, distribution and changes in the micro level and in the atomic resolution. The research also employed imaging simulation technology and density functional theory to explain the way the microstructures of materials interface impact the macro-performances.